Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1634330 | Procedia Materials Science | 2015 | 9 Pages |
Abstract
As the geometries of integrated circuits continue to shrink into the deep nanometer regime, the impact of on-chip interconnects is dominant on the overall system performance. This paper explores the power-delay trade-off in alternate repeater insertion techniques. The repeaters are placed along global on-chip interconnects to compensate the loss in the wires and to regenerate the signal strength. All the repeater insertion techniques with 3-pi RC distributed interconnect model are implemented at 45 nm and 180 nm technology with supply voltage operated at 1 GHz. The performance metrics considered to compare the alternate repeated interconnects are power dissipation, propagation delay and power-delay-product (PDP).
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