| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1635121 | Rare Metals | 2007 | 5 Pages |
Abstract
High quality epitaxial YBa2Cu3O7-δ (YBCO) superconducting films were fabricated on (OOl) LaAlO3 substrates using the direct-current sputtering method. The attainment of an unusually high film thickness (up to 2.0 um) without microcracking was attributed in part to the presence of pores correlated with yttrium-rich composition in the films. The influence of the film thickness on the microstructure was investigated by X-ray diffraction conventional scan (θ-2θ, Ï-scan, pole figure) and high-resolution reciprocal space mapping. The films were c-axis oriented with no a-axis-oriented grains up to the thickness of 2 μm. The surface morphology and the critical current density (Jc) strongly depended on the film thickness. Furthermore, the reasons for these thickness dependences were elucidated in detail.
Keywords
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Physical Sciences and Engineering
Materials Science
Metals and Alloys
Authors
XIONG Jie, QIN Wenfeng, TANG Jinlong, TAO Bowan, CUI Xumei, LI Yanrong,