| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1640642 | Transactions of Nonferrous Metals Society of China | 2009 | 5 Pages |
Abstract
Ta2O5 thin films were deposited by DC reactive magnetron sputtering followed by rapid thermal annealing(RTA). Influence of sputtering pressure and annealing temperature on surface characteristics, microstructure and optical property of Ta2O5 thin films were investigated. As-deposited Ta2O5 thin films are amorphous. It takes hexagonal structure (δ-Ta2O5) after being annealed at 800 °C. A transition from δ-Ta2O5 to orthorhombic structure (L-Ta2O5) occurs at 900–1 000 °C. Surface roughness is decreased after annealing at low temperature. Refractive index and extinction coefficient are decreased when annealing temperature is increased.
Related Topics
Physical Sciences and Engineering
Materials Science
Metals and Alloys
