Article ID Journal Published Year Pages File Type
1646298 Materials Letters 2012 4 Pages PDF
Abstract
► (002)-preferred ZnO thin film was deposited at ambient temperature with good quality. ► (103) texture was observed on the surface of the as-deposited film. ► VO concentration variation in the annealed films was confirmed from XPS O 1s analysis. ► VO was supposed to decrease the lattice parameter in the ZnO film.
Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
Authors
, , , , ,