Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1646298 | Materials Letters | 2012 | 4 Pages |
Abstract
⺠(002)-preferred ZnO thin film was deposited at ambient temperature with good quality. ⺠(103) texture was observed on the surface of the as-deposited film. ⺠VO concentration variation in the annealed films was confirmed from XPS O 1s analysis. ⺠VO was supposed to decrease the lattice parameter in the ZnO film.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Xinyi Li, Yunlan Wang, Weifeng Liu, Guoshun Jiang, Changfei Zhu,