Ion-induced secondary electrons emission measurement from MgO films deposited on multiwalled carbon nanotubes

This study reports on the ion-induced secondary electrons emission (SEE) from MgO films deposited on multiwalled carbon nanotubes (MWCNTs). MWCNTs are grown on quartz substrates using plasma enhanced chemical vapor deposition system and MgO films are deposited on that MWCNTs using electron-beam evaporation technique. The SEE coefficients are obtained from experimentally measured firing voltage. We observed stabilized and lower firing voltage of MgO films deposited on MWCNTs than that for MgO. The experimental results suggest that the density, uniformity and alignment of nanotubes influence the local electric field in nano-pores of MgO films which in turn affects the emission of secondary electrons from MgO surface.

► Ion-induced secondary electron emission (SEE) yield of MgO coated MWCNTs is measured. ► SEE yield depends on the density, uniformity and alignment of nanotubes in MgO. ► It is concluded that nano-pores due to MWCNTs in MgO films increase the SEE. ► Grain boundaries in MgO coated MWCNTs affect the SEE process.