| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1647223 | Materials Letters | 2012 | 4 Pages |
Abstract
⺠W-DLC film was treated by low temperature ion sulfuration. ⺠A soft WS2 layer about 100 nm in depth is formed on W-DLC film. ⺠A slight increase of sp2-C content in the DLC film is contributed to sulfuration. ⺠Sulfuration reduces the friction coefficient of W-DLC film.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Wen Yue, Xiaocheng Gao, Chengbiao Wang, Zhiqiang Fu, Xiang Yu, Jiajun Liu,