| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1648958 | Materials Letters | 2009 | 4 Pages |
Abstract
The role of aluminium incorporated into growing carbon nitride (CNx) films prepared by reactive dc-magnetron sputtering was investigated using X-ray photoelectron spectroscopy (XPS), Raman spectroscopy and high-resolution transmission electron microscopy (HRTEM). XPS analyses revealed the formation of Al-N bonding besides C-C and C-N bonds. With increasing Al concentrations above 11.8Â at.%, a structural transformation from essentially amorphous (a-) (CNx, AlN) phase to locally ordered microstructure comprising of fullerene-like (FL-) CNx nanostructures surrounded by a-(CNx, AlN) matrices was evidenced by Raman and HRTEM. The effect of aluminium in triggering FL-CNx nanostructures was elucidated from thermodynamic considerations.
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Authors
Y.F. Han, T. Fu, Y.G. Shen,