Article ID Journal Published Year Pages File Type
1648984 Materials Letters 2010 4 Pages PDF
Abstract

Tin oxide (SnO2) epitaxial film has been deposited on Y-stabilized ZrO2 (YSZ) (100) substrate by metalorganic chemical vapor deposition (MOCVD). Structural and optical properties of the film as well as the epitaxial mechanism have been investigated in detail. The results of structure analyses show that the obtained film is epitaxial SnO2 with orthorhombic columbite structure. A novel epitaxial relationship of orthorhombic SnO2(100)||YSZ(100) with SnO2 [001]||YSZ<001> was clearly observed from the interface area between the film and the substrate. The absolute average transmittance of the orthorhombic SnO2 film in the visible range exceeds 90%, and the optical band gap of the film is about 3.79 eV.

Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
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