| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1649654 | Materials Letters | 2009 | 5 Pages |
Abstract
During plastic deformation of FCC materials, dislocation density does not evolve uniformly but a dislocation cell/wall structure is formed. X-ray diffraction reciprocal space mapping is used to investigate this substructure within a single grain in a large grained aluminium polycrystal. A simple dislocation cell/wall model capable of computing numerical reciprocal space maps is presented. The model qualitatively captures the experimentally observed features.
Keywords
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Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
F. Hofmann, X. Song, S. Eve, S.P. Collins, A.M. Korsunsky,