Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1651034 | Materials Letters | 2008 | 4 Pages |
Abstract
The effects of moderate annealing temperature (600-800 °C) on the microstructure, fatigue endurance, retention characteristic, and remnant polarization (2Pr) of Bi3.25Eu0.75Ti3O12 (BET) thin films prepared by metal-organic decomposition (MOD) were studied in detail. 2Pr (66 µC/cm2 under 300 kV/cm), fatigue endurance (3% loss of 2Pr after 1.2 Ã 1010 switching cycles), and retention characteristic (no significant polarization loss after 1.8 Ã 105s) for BET thin film annealed at 700 °C are better than those for thin films annealed at other temperature. The mechanisms concerning the dependence of microstructure and ferroelectric properties on the annealing temperature were discussed.
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Authors
X.J. Zheng, L. He, M.H. Tang, Y. Ma, J.B. Wang, Q.M. Wang,