Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1652690 | Materials Letters | 2006 | 4 Pages |
Abstract
Thin films of Er3+-doped gallium lanthanum sulfide (GLS) glass were prepared by RF magnetron sputtering onto fused silica and BK7 glass substrates. The films were characterized by use of SEM imaging, X-ray diffractometry, and energy dispersive spectroscopy. They are shown to be glassy, uniform in composition, and to exhibit an RMS surface roughness of < 8 Å. The fluorescence lifetimes of the 4I11 / 2 → 4I13 / 2 and 4I13 / 2 → 4I15 / 2 transitions of Er3+ were measured at each processing stage.
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Authors
J.A. Frantz, J.S. Sanghera, L.B. Shaw, G. Villalobos, I.D. Aggarwal, D.W. Hewak,