| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1653491 | Materials Letters | 2007 | 5 Pages |
Abstract
Li2B4O7 polycrystalline films on silica glass and Si(111) substrates were prepared by chemical solution decomposition(CSD) method. After spin coating, the wet film was dried at 200 °C, and then annealed at different temperatures to form polycrystalline Li2B4O7 film. These annealed films were characterized by using X-ray diffraction (XRD), Fourier transformation infrared spectroscopy (FTIR), transmission electron microscope (TEM) and selective area electron diffraction (SAED). All these results show that the main component of the film is Li2B4O7 crystalline phase and the average crystalline size of these films is in the range of 20–50 nm.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Wenwei Ge, Huaijin Zhang, Yanting Lin, Xiaopeng Hao, Xiangang Xu, Jiyang Wang, Hongxia Li, Hongyan Xu, Minhua Jiang,