Article ID Journal Published Year Pages File Type
1653536 Materials Letters 2007 4 Pages PDF
Abstract

We observed a very unusual crystallization behavior in Nylon 6 by X-ray diffraction. The melted Nylon 6 films were quenched in oil baths with different temperatures for isothermal crystallization. When the Nylon 6 films were isothermally crystallized above 180 °C for 30 min and then quenched in ice water, three sharp diffraction peaks at 2θ = 9.4, 18.95 and 28.5° were observed in X-ray diffraction patterns. No diffraction peaks could be found at 2θ = 9.4, 18.95 and 28.5° from a series of calculated 2θ values for the α, γ, β and pleated α form crystals of Nylon 6. The locations of these peaks do not correspond with calculated 2θ values. When the film was slowly cooled from the melt state to 180 °C and was maintained at 180 °C for 30 min and then quenched to 0 °C, it could be found that these three reflections disappeared. If the Nylon 6 film isothermally crystallized at 180 °C for 30 min was not quenched to room temperature, but cooled to room temperature in air, these three diffraction peaks could not be observed.

Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
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