Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1654754 | Materials Letters | 2005 | 5 Pages |
Abstract
Electron backscattering diffraction (EBSD) investigations were carried out on three ultra-thin TiNi rolling sheet samples with thickness of 0.15, 0.2 and 0.3 mm, respectively. The microstructure and texture evolution were investigated as a function of the sheet thickness. The automated EBSD system allows integrating the grain boundary, grain size and the preferred orientation information to be revealed simultaneously. By ODF analysis, the preferred orientations are revealed as {111} <01¯1>, {223} <02¯1>, and {332} <11¯0> in the three TiNi sheets. The {111} <01¯1> component evolves stronger with reducing the thickness of the rolling sheet.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
S.C. Mao, X.D. Han, J.F. Luo, Z. Zhang,