| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1657934 | Surface and Coatings Technology | 2013 | 5 Pages |
Abstract
⺠Sharpness of the typical reflectance feature gradually degraded with implantation dose. ⺠Thickness of the implanted layer was ~ 45 nm, which agreed with SRIM calculations. ⺠Similar to DL band PL peak, the absorption tail red-shifted with tin implantation dose. ⺠The red-shifts were not caused by relative increase in concentration of LiZn.
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Authors
Giang T. Dang, Toshiyuki Kawaharamura, Noriko Nitta, Takashi Hirao, Toshimasa Yoshiie, Masafumi Taniwaki,