| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1658433 | Surface and Coatings Technology | 2012 | 5 Pages |
Abstract
⺠SIMS depth profile analysis is done on Ti samples after EP and MEP. ⺠SIMS spectra reveal lower Ti sample hydrogenation right after MEP. ⺠Higher Ti sample oxidation right after MEP was found. ⺠Near-surface hydrogen contents equalize after a one month leap.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Tadeusz Hryniewicz, Piotr Konarski, Ryszard Rokicki, Jan Valicek,