| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1660344 | Surface and Coatings Technology | 2009 | 4 Pages |
Abstract
Ternary transition metal nitrides have gained special attention in an effort to improve further the properties of the corresponding binary compounds. In this work, we present a comparative study of a very wide range of ternary transition metal nitrides of the form: TixMe1-xN and TaxMe1-xN (Me = Ti,Zr,Hf,Nb,Ta,Mo,W) over the whole x range (0 < x < 1) grown by Pulsed Laser Deposition (PLD) and by Dual Ion Beam Sputtering. We study the stability of the rocksalt structure in all these films experimentally and theoretically through ab-initio calculations. We investigate the validity of Vegard's rule and the effect of growth-dependent stresses to the lattice constant.
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Authors
G.M. Matenoglou, L.E Koutsokeras, Ch.E. Lekka, G. Abadias, C. Kosmidis, G.A. Evangelakis, P. Patsalas,