Article ID Journal Published Year Pages File Type
1660799 Surface and Coatings Technology 2007 8 Pages PDF
Abstract

A new method called time-delayed, time-resolved Langmuir probe measurement is used to measure pulsed plasmas to overcome the secondary electron emission during high-voltage pulses. This method has been verified with a good agreement with an in-situ Faraday cup dosimetry technique. The plasma characteristics of the pulsed-mode, non-continuous plasma and continuous plasma with high-voltage pulses are measured and analyzed using this method. The continuous plasma with high-voltage pulses shows higher plasma densities, lower working pressure and pulse voltage, larger and more flexible process windows, and less charging effect.

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Physical Sciences and Engineering Materials Science Nanotechnology
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