Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1662280 | Surface and Coatings Technology | 2007 | 5 Pages |
Abstract
TiO2 thin films have been deposited at low temperature using a new atmospheric pressure deposition process, which combines remote Atmospheric Pressure (AP) Plasma with Pulsed Injection Metallorganic Chemical Vapour Deposition (PIMOCVD). The effects of post-discharge plasma and deposition parameters have been studied with respect to the deposition kinetics, morphology, and microstructure of TiO2 films. It is shown that well-crystallised TiO2 anatase films can be obtained at a temperature of only 275 °C.
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Authors
C. Jiménez, D. De Barros, A. Darraz, J.-L. Deschanvres, L. Rapenne, P. Chaudouët, J.E. Méndez, F. Weiss, M. Thomachot, T. Sindzingre, G. Berthomé, F.J. Ferrer,