Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1663010 | Surface and Coatings Technology | 2007 | 4 Pages |
Abstract
Polyimide (PI) films were irradiated by 80Â MeV O6+ ions at different fluences of 8.5Â ÃÂ 1012Â ions/cm2, 1.5Â ÃÂ 1013Â ions/cm2 and 2.5Â ÃÂ 1013Â ions/cm2. The modified films were characterized by microhardness tester, LCR meter, FTIR spectroscopy and thermogravimetric analysis (TGA). It is observed that the hardness of the films increases as fluence increases. This may be attributed to the cross-linking effects as corroborated with FTIR spectra. A plot of conductivity versus log frequency displays a sharp increase in conductivity at a frequency of 20Â kHz, and the effect of irradiation is significant at higher fluences. The dielectric constant/loss is observed to change with the fluence. TGA thermograms indicate that the composition of the sample degrades progressively during irradiation due to the emission of hydrogen gas and/or other volatile gases. It suggests that ion beam irradiation converts the polymeric structure into a hydrogen depleted carbon network, which makes the polymer harder and more conductive.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Anjum Qureshi, N.L. Singh, A.K. Rakshit, F. Singh, D.K. Avasthi,