| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1663909 | Thin Solid Films | 2016 | 5 Pages |
Abstract
ZnO films have been used for precise stopping power measurement of MeV He-ions in the energy range from 200 to 5000Â keV. These results provide indispensable data for ion beam modification and analysis of ZnO.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Elżbieta Guziewicz, Andrzej Turos, Anna Stonert, Dmytro Snigurenko, BartÅomiej S. Witkowski, Ryszard Diduszko, Moni Behar,