Article ID Journal Published Year Pages File Type
1664039 Thin Solid Films 2016 7 Pages PDF
Abstract

•Stainless steel thin films were fabricated by thermal evaporation on quartz.•Alpha to gamma phase transformation of thin films was investigated.•Annealing of thin films reduces disruption in crystal lattice.•The stress of as-grown thin films was independent on the thin film thickness.•The stress of the thin films was reduced due to annealing.

In this work we report on phase transformation of 304 stainless steel thin films due to heat treatment. Ex-situ annealing was applied for evaporated 304 stainless steel thin films inside an ultra-high vacuum chamber with a pressure of 3 × 10− 7 Pa at temperatures of 500 °C and 600 °C. The structure of thin films was studied by X-ray diffraction (XRD) and conversion electron Mössbauer spectroscopy (CEMS) techniques. The results revealed a transformation from α-phase that exhibits a body-centered cubic structure (BCC) to γ-phase that exhibits a face-centered cubic (FCC) due to annealing. In addition, the percentage of γ-phase structure increased with the increase of annealing temperature. Annealing thin films increased the crystal size of both phases (α and γ), however, the increase was nonlinear. The results also showed that phase transformation was produced by recrystallization of α and γ crystals with a temporal evolution at each annealing temperature. The texture degree of thin films was investigated by XRD rocking curve method, while residual stress was evaluated using curvature method.

Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
Authors
, , ,