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A comparative transmission electron microscopy, energy dispersive x-ray spectroscopy and spatially resolved micropillar compression study of the yttria partially stabilised zirconia - porcelain interface in dental prosthesis

Article ID Journal Published Year Pages File Type
1664531 Thin Solid Films 2015 11 Pages PDF
Keywords
EDSBSEFIBYPSZYttria Partially Stabilised ZirconiaEnergy Dispersive X-ray SpectroscopySecondary electronTemFocused ion beamSEMScanning electron microscopyTransmission electron microscopy
Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
Preview
A comparative transmission electron microscopy, energy dispersive x-ray spectroscopy and spatially resolved micropillar compression study of the yttria partially stabilised zirconia - porcelain interface in dental prosthesis
Authors
Alexander J.G. Lunt, Gaurav Mohanty, Siqi Ying, Jiří Dluhoš, Tan Sui, Tee K. Neo, Johann Michler, Alexander M. Korsunsky,
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Journal
Thin Solid Films
Journal: Thin Solid Films
Related Categories
EDS
BSE
FIB
YPSZ
Yttria Partially Stabilised Zirconia
Energy Dispersive X-ray Spectroscopy
Secondary electron
Tem
Focused ion beam
SEM
Scanning electron microscopy
Transmission electron microscopy
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