| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1665161 | Thin Solid Films | 2014 | 5 Pages |
•Particle induced X-ray emission was used to analyze the composition of CZTSe films.•Energy dispersive X-ray spectroscopy tends to underestimate the Sn composition.•Local Raman intensity is related with the composition rather than the crystallinity.
Compositional and structural studies of Cu2ZnSnSe4 (CZTSe) thin films were carried out by X-ray diffraction, energy dispersive X-ray spectroscopy (EDS), particle induced X-ray emission (PIXE), photoluminescence, and Raman spectroscopy. CZTSe thin films with different compositions were deposited on sodalime glass by co-evaporation. The composition of the films measured by two different methods, EDS and PIXE, showed significant differences. Generally, the Zn/Sn ratio measured by EDS is larger than that measured by PIXE. Both the micro-PIXE and the micro-Raman imaging results indicated the compositional and structural inhomogeneity of the sample.
