| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1666116 | Thin Solid Films | 2013 | 5 Pages |
Abstract
⺠Mueller Matrix Ellipsometry used to detect small tilt angles of GaSb nanopillars ⺠Modeled as a graded anisotropic Bruggeman effective medium ⺠Two different gradient profiles; linear in diameter and linear in fill factor ⺠The off-diagonal elements allow for high sensitivity to the in plane anisotropies
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Authors
L.M.S. Aas, M. Kildemo, Y. Cohin, E. Søndergård,