Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1666184 | Thin Solid Films | 2013 | 5 Pages |
Abstract
⺠Impurity diffusion into Cu(In,Ga)Se2 from steel substrates is studied. ⺠Increased impurity content is seen when adding NaF as sodium source. ⺠Device performance correlates to Na and Fe contents. ⺠Loss in open circuit voltage for best device on steel as compared to glass substrate
Related Topics
Physical Sciences and Engineering
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Authors
C. Platzer-Björkman, S. Jani, J. Westlinder, M.K. Linnarsson, J. Scragg, M. Edoff,