Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1666236 | Thin Solid Films | 2013 | 11 Pages |
Abstract
By recording X-ray photoelectron spectroscopic binding energy shifts, while subjecting samples to a variety of optical and electrical stimuli, information about charge accumulation on materials or surface structures can be obtained. These stimuli included d.c. as well as a.c. electrical and/or optical pulses covering a wide frequency range (10â 3 to 106 Hz) for probing charging and/or photovoltage shifts, stemming from impurities, dopants, defects, etc., whether created intentionally or not. The methodology is simple to implement and provides several new dimensions for thin films and materials analyses.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Hikmet Sezen, Sefik Suzer,