| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1666696 | Thin Solid Films | 2013 | 5 Pages |
Abstract
⺠A way to probe the surface of materials. ⺠Refinement of diffraction patterns collected near the surface. ⺠Evolution of thin solid film versus the depth.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
David Simeone, Gianguido Baldinozzi, Dominique Gosset, Sophie Le Caer, Jean-François Bérar,