Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1666698 | Thin Solid Films | 2013 | 5 Pages |
Abstract
In-situ mechanical testing during X-ray diffraction is performed on electro-deposited nanocrystalline Ni. It is found that the evolution of inter-granular stresses with plastic deformation is altered compared to what is usually found for coarse-grained metals. The results are rationalized by insights gained from molecular dynamics and quantized crystal plasticity modelling.
► In-situ X-ray diffraction reveals little build-up of inter-granular stress in nc Ni. ► This may be explained using a new Quantized Crystal Plasticity model. ► The presence of a broad distribution of critical stresses is essential.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
S. Van Petegem, L. Li, P.M. Anderson, H. Van Swygenhoven,