Article ID Journal Published Year Pages File Type
1666698 Thin Solid Films 2013 5 Pages PDF
Abstract

In-situ mechanical testing during X-ray diffraction is performed on electro-deposited nanocrystalline Ni. It is found that the evolution of inter-granular stresses with plastic deformation is altered compared to what is usually found for coarse-grained metals. The results are rationalized by insights gained from molecular dynamics and quantized crystal plasticity modelling.

► In-situ X-ray diffraction reveals little build-up of inter-granular stress in nc Ni. ► This may be explained using a new Quantized Crystal Plasticity model. ► The presence of a broad distribution of critical stresses is essential.

Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
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