Multireflection grazing incidence diffraction used for stress measurements in surface layers

The geometry based on the multireflection grazing incidence X-ray diffraction can be applied to measure residual stresses. Using this method, it is possible to perform a non-destructive analysis of the heterogeneous stresses for different and well defined volumes below the surface of the sample (range of several μm). As the result, the average values of stresses weighted by absorption of X-ray radiation are measured. In this work the stress profiles as a function of penetration depth were determined for mechanically polished Al sample. Measurements and verification of the method were performed using classical X-ray diffractometer and synchrotron radiation with different wavelengths.

► Grazing incident X-ray diffraction enables stress measurements in surface layers. ► Multireflection grazing incidence method was verified using synchrotron radiation. ► Using synchrotron radiation the range of studied depth can be increased. ► Mechanical polishing causes stress gradient in the surface layer.