| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1666898 | Thin Solid Films | 2013 | 8 Pages |
The flexibility and electrical stability of highly conductive and transparent amorphous indium tin oxide (a-ITO) films coated on polyethylene terephthalate and polyethylene naphthalate substrates were investigated by buckling tests with in situ monitoring of the electrical resistance. Monotonic and cyclic loading tests of the ITO/polymer systems were conducted. The results show that monotonic buckling in tension is more critical for electromechanical stability of ITO films than in compression (an increase in electrical resistance was observed at a critical radius of curvature, of ~ 3 and ~ 1 mm, respectively for both cases investigated). In contrast, cyclic loading tests show that the compression mode is more critical than the tensile mode which may be a result of the residual stress present in the film structure. Failure of the ITO film was caused by buckling-driven delamination observed using scanning electron microscopy after the tests. The presence of residual stress could mean that buckling-driven delamination is the dominant failure mode for ITO/polymer systems under repeated flexing. In general, comparable electromechanical stability was observed in both cases. Investigating the electromechanical response of such material systems is important for polymer substrate selection and life-time prediction of flexible polyester-based electronic devices.
► Cyclic buckling investigation of flexible electrodes. ► Importance of ITO surface compression mode as opposed to tension. ► Role of ITO residual stresses on controlled buckling investigations.
