| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1667074 | Thin Solid Films | 2012 | 4 Pages |
Films of lanthanum tungstate, 3 μm in thickness, were fabricated by means of pulsed laser deposition on a Pd foil. The films were characterized by X-ray diffraction, scanning electron microscopy, X-ray photoelectron spectroscopy and their electrical conductivity was measured at temperatures between 400 and 800 °C in different gas atmospheres. The films' structure and electrical characteristics are close to what is reported in the literature for corresponding polycrystalline material. The films exhibit fairly high proton conductivity at elevated temperatures, which make them interesting for components in hydrogen-related technologies. Changes in microstructure and the crystallographic orientation observed at higher temperatures were accompanied by changes in the conductivity characteristics.
► Pulsed laser deposition of lanthanum tungstate films. ► Characterization of crystal structure and morphology. ► Morphology changes during annealing at elevated temperature. ► Well controlled polycrystalline films with defined stoichiometry. ► Conductivity characteristics correspond to bulk behavior.
