| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1667099 | Thin Solid Films | 2012 | 8 Pages |
Abstract
⺠Cu modification of a ZnO thin film improves c-axis alignment. ⺠Al modification of ZnO thin film delays crystallization. ⺠At 1:10 mol/mol Zn, the ZnO structure cannot accommodate all Cu or Al atoms. ⺠Excess modifier causes high film resistance and low sensitivity as O2 sensors.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
James B. Miller, Tejasvi Ashok, Sojung Lee, Esteban Broitman,