| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1667124 | Thin Solid Films | 2012 | 4 Pages |
Abstract
⺠Microstructure of Ba0.5Sr0.5TiO3 single-layered and multilayered films. ⺠Dielectric properties of Ba0.5Sr0.5TiO3 single-layered and multilayered films. ⺠Critical thickness for the formation of misfit dislocations in the films.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Y.Q. Wang, W.S. Liang, W.J. Kong, Peter K. Petrov, Neil M. Alford,