Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1667298 | Thin Solid Films | 2012 | 5 Pages |
Abstract
Cu6PS5I thin films were deposited onto silicate glass substrates by non-reactive radio frequency magnetron sputtering. Spectrometric and isoabsorption studies of Cu6PS5I thin films in the temperature interval 77–500 K were performed. Structural studies were carried out using X-ray diffraction and scanning electron microscopy techniques. Temperature evolution of optical transmission spectra as well as temperature dependences of optical pseudogap and Urbach energy is investigated. The influence of temperature-related and structural disordering on the Urbach tail is studied.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
I.P. Studenyak, M. Kranjčec, V.Yu. Izai, A.A. Chomolyak, M. Vorohta, V. Matolin, C. Cserhati, S. Kökényesi,