| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1667327 | Thin Solid Films | 2012 | 5 Pages |
Abstract
TiO2/MgF2 bi-layers were prepared by sol–gel processing in both stacking sequences. Films were characterized by scanning electron microscopy, UV–vis spectrometry, and ellipsometric porosimetry. The results obtained by the different methods are compared. The validity and limitations of the respective techniques are discussed with special focus on film porosity and the interface between the TiO2 and MgF2 material.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Andreas Bittner, Angelika Schmitt, Rainer Jahn, Peer Löbmann,