| Article ID | Journal | Published Year | Pages | File Type | 
|---|---|---|---|---|
| 1667541 | Thin Solid Films | 2012 | 4 Pages | 
Abstract
												We realized the epitaxial growth of a Sr layer on Si(111) with an atomically abrupt heterointerface – in spite of its large lattice mismatch (12%) with Si – by introducing a monoatomic layer of H on Si. In order to identify the buried H, we carried out a combination analysis involving neutron reflectometry and resonant nuclear reaction of 1H(15N,αγ)12C analysis. We found different neutron reflectivity profiles resulting from a contrast variation between the H and D atoms at the buried heterointerface. Furthermore, the depth γ-ray intensity profiles revealed that the H at the heterointerface acts as an effective buffer layer that enables it to manage the highly mismatched epitaxy on Si.
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											Authors
												T. Yamazaki, H. Asaoka, T. Taguchi, S. Yamamoto, D. Yamazaki, R. Maruyama, M. Takeda, S. Shamoto, 
											