Article ID Journal Published Year Pages File Type
1668021 Thin Solid Films 2011 5 Pages PDF
Abstract

Amorphous Zn and ZnO thin films have been prepared by radio frequency magnetron sputtering on Cu substrates and have been characterized by X-ray diffraction, scanning electron microscope, and Raman spectroscopy. The electrochemical performance of the thin films has been studied by galvanostatic cycling and cyclic voltammetry. The voltage dependence of Li-ion chemical diffusion coefficients, D˜Li, of the films has been determined by galvanostatic intermittent titration technique (GITT) and electrochemical impedance spectroscopy (EIS). It is found that the amorphous Zn and ZnO films exhibit almost the same D˜Li values ranging from 10− 14 to 10−12 cm2 s− 1 and similar Li-ion transport characteristics determined both by GITT and by EIS methods.

Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
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