Article ID Journal Published Year Pages File Type
1668064 Thin Solid Films 2011 4 Pages PDF
Abstract

Copper loaded TiO2 brookite thin films were deposited on glass substrates using the dip-coating method. The crystalline structure of the films was characterized by X-ray diffraction analysis. X-ray photoelectron spectroscopy was used to evaluate the properties of the film surfaces. The transmittance spectra of the films were obtained by the Shimadzu multi-purpose spectrophotometer. The water contact angle on the film surfaces during irradiation and storage in a dark place was measured by a contact angle analyzer. The results indicate that Cu loading did not affect the transmittance spectra, whereas it had a significant effect on the hydrophilicity of the TiO2 film surface.

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Physical Sciences and Engineering Materials Science Nanotechnology
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