| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1668128 | Thin Solid Films | 2011 | 4 Pages |
Abstract
A study of the thermal stability of transparent conducting ZnO thin film in air is reported. By depositing a thin ZnO overlayer (~ 10 nm) on aluminum and gallium-codoped ZnO thin film (AGZO), the thermal stability of the AGZO thin film could be significantly improved. Electrical and structural characterizations of the AGZO thin films with and without the overlayer were performed and the mechanism of the enhanced thermal stability by the overlayer was proposed.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
J.-H. Kang, D.W. Kim, J.H. Kim, Y.S. Lim, M.-H. Lee, W.-S. Seo, H.J. Choi, K.H. Seo, M.G. Park,