| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1668314 | Thin Solid Films | 2011 | 11 Pages |
Abstract
A non-contact, optical conductivity measurement possibility by use of ultra-violet/visible/near infra-red spectroscopy has been provided. Contact-free, optically measured conductivities were compared with those, measured electrically with a conventional four-tip measurement system.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
A. Stadler, H. Dittrich,