Article ID Journal Published Year Pages File Type
1668712 Thin Solid Films 2010 4 Pages PDF
Abstract

The microstructures and electrical properties of 8.4% nitrogen-doped GeTe and GeBi(6 at.%)Te films thermally annealed in N2 atmosphere were investigated. With the addition of Bi to N-doped GeTe films, the initial crystallization temperature was reduced and crystallization speed slowed. The N-doped GeBiTe films showed a rapid increase in crystallite size compared to the N-doped GeTe films. The formation energy of the nucleus may be lower due to the Bi atoms and the growth speed may be slower.

Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
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