| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1668745 | Thin Solid Films | 2010 | 4 Pages |
Abstract
Low-resistance ohmic contacts are essential to improve the performance of pentacene-based electronic and optoelectronic devices. In this study, we reported ohmic contact formation at the indium tin oxide (ITO)/pentacene and indium cerium oxide (ICO)/pentacene interfaces. According to the observed results from current-voltage and Kelvin probe measurements, we found that the lower contact resistivity of the ICO/pentacene sample than the ITO/pentacene sample may be attributed to the higher surface work function of ICO than ITO.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Jian-An Chu, Jian-Jhou Zeng, Kuo-Chen Wu, Yow-Jon Lin,