Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1669014 | Thin Solid Films | 2011 | 4 Pages |
Abstract
For the interpretation of the results two defect models are taken into account.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
H. Zachmann, S. Puttnins, F. Daume, A. Rahm, K. Otte,