| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1669378 | Thin Solid Films | 2010 | 5 Pages |
Abstract
A system of 0.03 mol Nd3+-doped (Y,Gd)BO3 phosphors were prepared by the conventional solid state reaction method for different concentrations of Gd3+ ions and were characterized by X-ray diffraction (XRD), field emission scanning electron microscopy (FESEM) and NIR emission measurements. The emitted radiation was dominated by 1057 nm peak in the NIR region as a result of 4F3/2 → 4I11/2 transitions of Nd3+ ions. As the concentration of Gd3+ ions increases from 0.00 to 0.57 mol, the grain sizes and the intensity of NIR emission peaks were improved. The results are discussed in comparison with similar reported works.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Soung Soo Yi, Ji-Chul Kim, Dong Woo Kim, R. Balakrishnaiah, Sung Hoon Kim, Kiwan Jang, Ho Sueb Lee, Byung Kee Moon, Jung Hyun Jeong,