| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1669544 | Thin Solid Films | 2009 | 4 Pages |
SiOx coatings were prepared by capacitively coupled plasma enhanced chemical vapor deposition on polyethyleneterephtalate substrates in 23 kHz middle-frequency and radio frequency power supplies, respectively, where hexamethyldisiloxane was used as gas source. The influences of discharge conditions on gas phase intermediate species and active radicals for SiOx formation was investigated by mass spectrometry as real-time in-situ diagnosis. The deposited SiOx coating chemical structures were also analyzed by Fourier transform infrared spectroscopy. Meanwhile, the film barrier property, oxygen transmission rate, was measured at 23 °C and 50% humidity circumstance. The better barrier property was obtained in the MF power source depositing SiOx coated PET.
