Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1670017 | Thin Solid Films | 2010 | 4 Pages |
Abstract
SiC fiber was fabricated by chemical vapor deposition on tungsten filament heated by direct current in a CH3SiCl3–H2 gas system. Microstructure of W/SiC interfacial reaction zone in the fiber was identified by means of scanning electron microscope and transmission electron microscope. Results showed that the thickness of the interfacial reaction zone is between 350 and 390 nm, and two reaction products of W5Si3 and WC were formed during fabricating SiC fiber. Electron diffraction analysis and composition detection indicated that W5Si3 is adjacent to tungsten core and WC is adjacent to SiC sheath, and the W/SiC interface can be described as W/W5Si3/WC/SiC. Furthermore, the formation mechanism of the interfacial reaction zone is discussed.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Rong-jun Zhang, Yan-qing Yang, Wen-tao Shen, Chen Wang,