Article ID Journal Published Year Pages File Type
1670087 Thin Solid Films 2010 6 Pages PDF
Abstract

P- and n-type channel thin film transistors (OTFTs) were fabricated by using hexadecahydrogen copper phthalocyanine (H16CuPc) and hexadecafluoro copper phthalocyanine (F16CuPc) molecules, respectively. Top-contact and bottom-contact source-drain configurations were used for both semiconductors. Furthermore, the temperature and film thickness dependences on the mobility values were measured in the saturation regime of source-drain current. Unipolar mobilities in such single-layer OTFTs were correlated to thin film morphology by X-ray diffraction analysis and atomic force microscopy measurements. Shelf-life time tests of p-type and n-type OTFTs are detailed as OTFT configuration and substrate temperature dependence over a time period of 100 days.

Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
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