Article ID Journal Published Year Pages File Type
1670101 Thin Solid Films 2008 5 Pages PDF
Abstract

The structure of a 30 nm thick pentacene film grown by molecular beam deposition on an oxygen passivated Cu(110) single crystal has been investigated ex-situ by X-ray diffraction methods. It is shown that pentacene crystallizes in two known bulk polymorphs with four unique crystal orientations. In all four cases, a principal pentacene direction is aligned along the surface corrugation provided by the Cu(110)–(2 × 1)O reconstruction. Since overlayer and substrate form incommensurate lattices, the results cannot be understood by classical criteria of organic epitaxy and the importance of one dimensional alignment is discussed.

Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
Authors
, , , , , , , ,