Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1670101 | Thin Solid Films | 2008 | 5 Pages |
Abstract
The structure of a 30 nm thick pentacene film grown by molecular beam deposition on an oxygen passivated Cu(110) single crystal has been investigated ex-situ by X-ray diffraction methods. It is shown that pentacene crystallizes in two known bulk polymorphs with four unique crystal orientations. In all four cases, a principal pentacene direction is aligned along the surface corrugation provided by the Cu(110)–(2 × 1)O reconstruction. Since overlayer and substrate form incommensurate lattices, the results cannot be understood by classical criteria of organic epitaxy and the importance of one dimensional alignment is discussed.
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Nanotechnology
Authors
M. Koini, T. Haber, O. Werzer, S. Berkebile, G. Koller, M. Oehzelt, M.G. Ramsey, R. Resel,