Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1670346 | Thin Solid Films | 2010 | 4 Pages |
Abstract
Growth of M-plane GaN on (100) LiGaO2 was achieved using plasma-assisted molecular beam epitaxy. Thermal annealing of the LiGaO2 wafer was found to lead to a substrate surface suitable for growth. Structural and morphological analysis was performed using x-ray and reflective high energy electron diffraction, scanning electron and atomic force microscopy. X-ray diffraction results show very high phase purity and a relaxation state of the GaN film close to 80%. The surface morphology, showing characteristic M-plane streaks, is flat and smooth.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
R. Schuber, M.M.C. Chou, D.M. Schaadt,